• DocumentCode
    2256324
  • Title

    Finding reset nondeterminism in RTL designs - scalable X-analysis methodology and case study

  • Author

    Chou, Hong-Zu ; Yu, Haiqian ; Chang, Kai-Hui ; Dobbyn, Dylan ; Kuo, Sy-Yen

  • Author_Institution
    Electr. Eng. Dept., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    1494
  • Lastpage
    1499
  • Abstract
    Due to increases in design complexity, routing a reset signal to all registers is becoming more difficult. One way to solve this problem is to reset only certain registers and rely on a software initialization sequence to reset other registers. This approach, however, may allow unknown values (also called X-values) in uninitialized registers to leak to other registers, leaving the design in a nondeterministic state. Although logic simulation can find some X-problems, it is not accurate and may miss bugs. A recent approach based on symbolic simulation can handle Xs accurately; however, it is not scalable. In this work we analyze the characteristics of X-problems and propose a methodology that leverages the accuracy of formal X-analysis and can scale to large designs. This is achieved by our novel partitioning techniques and the intelligent use of waveforms as stimulus. We applied our methodology to an industrial design and successfully identified several Xs unknown to the designers, including three real bugs, demonstrating the effectiveness of our approach.
  • Keywords
    logic design; logic simulation; waveform analysis; RTL design; X-problem; design complexity; industrial design; logic simulation; partitioning technique; register reset; reset nondeterminism; reset signal routing; scalable X-analysis methodology; software initialization sequence; symbolic simulation; waveform; Arithmetic; Circuits; Computer bugs; Hardware; Logic; Registers; Routing; Scalability; Signal design; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457048
  • Filename
    5457048