DocumentCode
2256554
Title
A synchronizer design based on wagging
Author
Alshaikh, Mohammed ; Kinniment, David ; Yakovlev, Alexandre
Author_Institution
Sch. of EECE, Newcastle Univ., Newcastle upon Tyne, UK
fYear
2010
fDate
19-22 Dec. 2010
Firstpage
415
Lastpage
418
Abstract
The reliability of a synchronizer depends on its recovery time from metastability, a time which is reduced if the delay through the synchronizer flip flops is large. The D to Q delay in a dual edge triggered D flip flop based on wagging is lower than in other designs allowing more time for metastability recovery. We also apply wagging to the synchronizer itself, reducing its delay even more when compared with conventional cascaded two flip-flops single clock cycle synchronizer, hence increasing the time available for recovery from metastability, and improving its latency. This advantage is greater in multiple cycle synchronizers.
Keywords
circuit reliability; circuit stability; flip-flops; network synthesis; metastability; reliability; synchronizer design; synchronizer flip flops; wagging;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics (ICM), 2010 International Conference on
Conference_Location
Cairo
Print_ISBN
978-1-61284-149-6
Type
conf
DOI
10.1109/ICM.2010.5696176
Filename
5696176
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