DocumentCode
2256977
Title
Boron nitride based poly (phenylene sulfide) compsoites with enhanced thermal conductivity and breakdown strength
Author
Xingyi Huang ; Wenhao Liu ; Pingkai Jiang ; Tanaka, T.
Author_Institution
Shanghai Key Lab. of Electr. Insulation & Thermal Aging, Shanghai Jiao Tong Univ., Shanghai, China
fYear
2011
fDate
6-10 Sept. 2011
Firstpage
35
Lastpage
38
Abstract
Dielectric polymer composites with high thermal conductivity and high breakdown strength have wide applications in electronic devices and electrical equipment. In this study, poly (phenylene sulfide) [PPS] and boron nitride (BN) were selected for preparing high thermal conductivity composites for high temperature insulation application. The composites were prepared by melt compounding to contain 0-40.0 wt% (BN). Laser flash method was used to measure the thermal conductivity. As a result, the composites exhibit significantly enhanced thermal conductivity when compared with the pure polymer. For instance, the composite sample shows an increase of thermal conductivity from 0.28 W/(m·K) (the pure PPS) to 1.21 W/(m·K) when it contains 40.0 wt% BN. Weibull statistical distribution was used to analyze the breakdown data and the characteristic breakdown strength was used to compare the breakdown strength of various samples. It was found that, except the sample containing the low concentration of BN filler, the composites show enhanced breakdown strength when compared with the pure PPS. Scanning electron microcopy (SEM) results show that the BN flakes are homogeneously distributed in the PPS matrix. Thermogravimetric analysis shows that the composites have increased thermal stability when compared with the pure PPS.
Keywords
Weibull distribution; composite materials; electric breakdown; electronics packaging; permittivity; scanning electron microscopy; thermal analysis; thermal conductivity; Weibull statistical distribution; breakdown strength; dielectric polymer composites; enhanced thermal conductivity; high temperature insulation; laser flash method; melt compounding; poly(phenylene sulfide) composites; scanning electron microcopy; thermogravimetric analysis; Conductivity; Electric breakdown; Electronic packaging thermal management; Insulation; Polymers; Thermal conductivity; Thermal stability; boron nitride; breakdown srength; polyphenylene sulfide; thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulating Materials (ISEIM), Proceedings of 2011 International Conference on
Conference_Location
Kyoto
Print_ISBN
978-4-88686-074-3
Type
conf
DOI
10.1109/ISEIM.2011.6826270
Filename
6826270
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