Title :
Panel session - great challenges in nanoelectronics and impact on academic research: More than Moore or Beyond CMOS?
Author :
De Keersmaeker, R ; Roukes, M. ; Antoinadis, D. ; De Man, H. ; Bourianoff, G. ; Brillouet, M. ; Samuelson, Lars
Author_Institution :
IMEC and Catrene, BE
Abstract :
This panel session will address the post-CMOS research great challenges and opportunities corresponding to the More Than Moore and Beyond CMOS domains. The opening talk of the panel will set the ground for discussion with some key examples placed at the intersection of the two domains. Especially the role of functional diversification and of new research and application drivers, different from scaling, will be critically discussed by a team of high-level experts in the field. Moreover, the impact of post-CMOS era on the way the academic research and the education of engineering are conceived today and should be adapted in the future will be the center of the debate.
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5457084