DocumentCode :
2257078
Title :
Electrical characterization of quad flat non-lead package for RFIC applications
Author :
Chen, Nansen ; Chiang, Kevin ; Her, T.D. ; Lai, Yeong-Lin ; Chen, Chichyang
Author_Institution :
R&D Div., Siliconware Precision Ind. Co. Ltd, Taichung, Taiwan
fYear :
2001
fDate :
2001
Firstpage :
266
Lastpage :
269
Abstract :
The QFN package is a near chip scale package plastic encapsulated package with a coppery leadframe substrate. The purpose of this paper was to establish the wideband equivalent circuit model of QFN packages for RF applications. Only short-path configuration was required for S-parameter measurement to achieve this purpose. The comparison of S11 and S21 between S-parameter measurement and optimized equivalent circuit model verified that those results were well matched and optimized. The parasitic parameters of equivalent circuit were reliable up to 6 GHz. The methods proposed in this paper may reduce the cost for samples preparation and chip simulation run time
Keywords :
S-parameters; chip scale packaging; encapsulation; equivalent circuits; plastic packaging; 6 GHz; Cu; RFIC applications; S-parameter measurement; chip scale package; copper leadframe substrate; electrical characteristics; equivalent circuit model; parasitic parameters; plastic encapsulation; quad flat nonlead package; Chip scale packaging; Circuit simulation; Costs; Equivalent circuits; Plastic packaging; Radio frequency; Radiofrequency integrated circuits; Scattering parameters; Semiconductor device measurement; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2001 International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7432-0
Type :
conf
DOI :
10.1109/ISDRS.2001.984492
Filename :
984492
Link To Document :
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