Title :
Reducing the leakage of memory blocks aggressively
Author :
El-Dib, Dalia A. ; Shawkey, Heba A. ; Abid, Z.
Author_Institution :
Dept. of CEIT, Dar Al Uloom Univ., Riyadh, Saudi Arabia
Abstract :
Excessive leakage of cache blocks encourages forcing the cache block into low-leakage state all the time except during read/write operations. By retaining the values of the cache cells during low leakage state, the penalty for re-activating the sleepy cache cells is also reduced. This is achieved using aggressive policies with simple control strategies using one of two methods. Either by adding a low voltage supply, operating the cache at low voltage all the time and enabling normal voltage only during a read/write operation to the cache line or by adding a ground gating NMOS transistor, which cuts the path from the supply voltage to ground all the time except during a read/write operation to the cache line. Both methods succeed to reduce leakage power during idle state by around 90% using minimum hardware control overhead, but suffer from process variation vulnerability and lower SNM.
Keywords :
MOSFET; cache storage; semiconductor storage; cache blocks; ground gating NMOS transistor; leakage reduction; memory blocks; process variation vulnerability; read/write operation; Delay; Leakage current; Noise; Random access memory; Stability analysis; Transistors; Voltage measurement;
Conference_Titel :
Microelectronics (ICM), 2010 International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-61284-149-6
DOI :
10.1109/ICM.2010.5696204