• DocumentCode
    2257100
  • Title

    Integrated charge-pump phase-locked loop with SC-loop filter for capacitive microsensor readout

  • Author

    Speeti, Timo ; Aaltonen, Lasse ; Halonen, Kari

  • Author_Institution
    Electron. Circuit Design Lab., Helsinki Univ. of Technol., Espoo, Finland
  • fYear
    2009
  • fDate
    24-27 May 2009
  • Firstpage
    1373
  • Lastpage
    1376
  • Abstract
    In this paper, simulated and measured phase noise characteristics for a charge-pump phase-locked loop (PLL) with a switched capacitor loop filter are presented. The PLL is fabricated using a 0.35 mum high-voltage CMOS technology. The PLL is designed for a reference frequency range from 3 kHz to 10 kHz, for divider value of 32, and to operate in temperature range from 40degC to +85degC and with 2.5 to 3.6 V supply. Measured results indicate that the SC-filter can be used to replace the conventional RC-filter in order to reduce area.
  • Keywords
    CMOS integrated circuits; RC circuits; charge pump circuits; microsensors; phase locked loops; phase noise; switched capacitor filters; capacitive microsensor readout; conventional RC-filter; frequency 3 kHz to 10 kHz; high-voltage CMOS technology; integrated charge-pump phase-locked loop; phase noise; size 0.35 mum; switched capacitor loop filter; temperature 40 degC to 85 degC; voltage 2.5 V to 3.6 V; CMOS technology; Capacitors; Charge pumps; Current measurement; Filters; Microsensors; Noise measurement; Phase locked loops; Phase measurement; Phase noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3827-3
  • Electronic_ISBN
    978-1-4244-3828-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2009.5118020
  • Filename
    5118020