Title :
ENOB calculation for ADCs with input-correlated quantization error using a sine-wave test
Author :
Weaver, Skyler ; Hershberg, Benjamin ; Moon, Un-Ku
Author_Institution :
Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
Abstract :
The equation for calculating ENOB from SNDR of a sine-wave test is only accurate when noise is uncorrelated to the input. In this paper, the equation for calculating ENOB from SNDR is derived for an ideal and a uniform stochastic ADC. The result of these derivations shows that calculating ENOB from SNDR using the conventional equation causes a better-than-actual result in the case a uniform stochastic ADC.
Keywords :
analogue-digital conversion; ENOB calculation; input-correlated quantization error; sine-wave test; uniform stochastic ADC; Equations; Mathematical model; Probability density function; Quantization; Random variables; Signal to noise ratio;
Conference_Titel :
Microelectronics (ICM), 2010 International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-61284-149-6
DOI :
10.1109/ICM.2010.5696205
