DocumentCode :
2257127
Title :
Peltier effect induced correction to ohmic resistance
Author :
Cheremisin, M.V.
Author_Institution :
A.F. Ioffe Phys. Tech. Inst., St. Petersburg, Russia
fYear :
2001
fDate :
2001
Firstpage :
274
Lastpage :
277
Abstract :
The crucial point of the present paper is that the Peltier effect which is linear in current influences ohmic measurements and results in a correction to the resistance measured. Under current carrying conditions, one of the sample contacts is heated and the other is cooled because of the Peltier effect. The temperature gradient established is proportional to the current. The Thomson heat is then proportional to the square of the current and can be neglected. Finally, the voltage swing across the circuit includes the thermoelectromotive force induced by the Peltier effect, which is linear in current. Accordingly, there exists a thermal correction to the ohmic resistance of the sample. The correction should be in comparison with ohmic resistance of the conductor. Above some critical frequency, dependent on thermal inertial effects, the correction disappears
Keywords :
Peltier effect; contact resistance; ohmic contacts; temperature distribution; Joule heat; Peltier effect induced correction; Thomson effect; critical frequency; current carrying conditions; ohmic resistance; temperature gradient; thermal correction; thermal inertial effects; thermoelectromotive force; voltage swing; Circuits; Conductors; Current measurement; Electrical resistance measurement; Frequency; Temperature; Thermal force; Thermal resistance; Thermoelectricity; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2001 International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7432-0
Type :
conf
DOI :
10.1109/ISDRS.2001.984494
Filename :
984494
Link To Document :
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