Title :
2006 IEEE International Workshop on Memory Technology, Design, and Testing - Title
Abstract :
The following topics are dealt with: memory diagnosis and repair; memory device and organization; memory design and testing; flash and SRAM characterization
Keywords :
DRAM chips; SRAM chips; fault diagnosis; flash memories; integrated circuit design; integrated circuit testing; integrated memory circuits; DRAM; SRAM; flash memories; memory design; memory diagnosis; memory organization; memory repair; memory testing;
Conference_Titel :
Memory Technology, Design, and Testing, 2006. MTDT '06. 2006 IEEE International Workshop on
Conference_Location :
Taipei
Print_ISBN :
0-7695-2572-5
DOI :
10.1109/MTDT.2006.4
