• DocumentCode
    2257436
  • Title

    Interference pattern formation in the second-order intensity correlation with beams orthogonally polarized

  • Author

    Vidal, I. ; Caetano, D.P. ; Olindo, C. ; Fonseca, E.J.S. ; Hickmann, J.M.

  • Author_Institution
    Inst. de Fis., Univ. Fed. de Alagoas, Maceio
  • fYear
    2008
  • fDate
    4-9 May 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Considering the polarization state of the pseudothermal light beams, we demonstrate that the nonlocal second-order interference pattern formation does not depend on the polarization of the beams crossing the different parts of a distributed double-slit.
  • Keywords
    light interference; light polarisation; optical correlation; pattern formation; distributed double-slit; nonlocal second-order interference pattern formation; polarization; pseudothermal light beams; second-order intensity correlation; Heterojunction bipolar transistors; Interference; Light sources; Optical imaging; Optical polarization; Optical recording; Optical retarders; Pattern formation; Quantum mechanics; Testing; (110.1650) Coherence imaging; (270.1670) Coherent optical effects;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-859-9
  • Type

    conf

  • Filename
    4572387
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2257436