Title :
Role of UV radiation in pulsed flashover along vacuum-epoxy/nano TiO2 composite interface
Author :
Yonghong Cheng ; Zengbin Wang ; Kai Wu ; Xi Chen ; Manping Li ; Liang Chen
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
This paper aimed at clarifying the effect of UV illumination on the pulsed vacuum flashover of TiO2 (titania)/epoxy nano composites. Vacuum surface flashover voltage under pulsed voltage, thermally stimulated depolarization current (TSDC) and photoelectrical current were investigated. It was found that flashover voltage of all the samples was decreased by UV illumination. Flashover voltage reduction of neat epoxy is the smallest, and that of nano composite increases with the decrease of filler content. The degradation of flashover voltage is congruous with the amount of shallow-like traps but has no evident correlation with total amount of traps, whereas photoelectrical current is mainly affected by total amount of traps. As a result, it was clarified that UV radiation in flashover can improve both the electron emission and charge neutralization through affecting the charging and discharging process of traps. Moreover, the effect of UV radiation on shallow-like traps is dominant in the flashover process.
Keywords :
electron emission; epoxy insulation; flashover; nanocomposites; photoelectricity; thermally stimulated currents; titanium compounds; ultraviolet radiation effects; TSDC; TiO2; UV radiation; charge neutralization; electron emission; filler content; flashover voltage reduction; photoelectrical current; pulsed vacuum flashover; shallow-like traps; thermally stimulated depolarization current; vacuum surface flashover; vacuum-epoxy nanocomposite interface; Current measurement; Electrodes; Electron traps; Flashover; Lighting; Vacuum systems; Voltage measurement; TSDC; UV; epoxy; flashover; photoelectrical; titania; trap;
Conference_Titel :
Electrical Insulating Materials (ISEIM), Proceedings of 2011 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-4-88686-074-3
DOI :
10.1109/ISEIM.2011.6826297