DocumentCode :
2257695
Title :
Electrochemical analysis of cathode in TSV copper electroplating
Author :
Haiyong Cao ; Xue Feng ; Qi Sun ; Wei Luo ; Huiqin Ling ; Jiangyan Sun ; Ming Li
Author_Institution :
Sch. of Mater. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2012
fDate :
10-12 Dec. 2012
Firstpage :
1
Lastpage :
4
Abstract :
In TSV copper electroplating, the most important is to form the “bottom up” deposition. In order to achieve this kind of super-filling, additive in the electroplating bath need to play its own role at the respective position. Accelerator adsorb at the bottom of the via to accelerate the deposition of copper while suppressor mostly adsorb at the top of the via to inhibit the deposition. Therefore, vias could be supper-filled without any void. In this paper, bis(3-sulfopropyl) disulfide (SPS) and polyethylene glycol (PEG) were used as accelerator and suppressor respectively. The supper-filling mechanism and the competitive adsorption of SPS and PEG were being researched by means of linear sweep voltammetry (LSV) and cyclic voltammogram (CV). The electrochemical analysis and the experimental plating are closely related.
Keywords :
cathodes; copper; electronics packaging; electroplating; organic compounds; voltammetry (chemical analysis); Cu; LSV; PEG; SPS; TSV copper electroplating; accelerator; additive; adsorption; bis(3-sulfopropyl) disulfide; cathode; cyclic voltammogram; deposition; electrochemical analysis; linear sweep voltammetry; polyethylene glycol; super-filling mechanism; suppressor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-2654-4
Type :
conf
DOI :
10.1109/ICSJ.2012.6523399
Filename :
6523399
Link To Document :
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