DocumentCode :
2257819
Title :
Novel DAF (Die Attach Film) separation technologies for ultra-thin chip
Author :
Takyu, S. ; Kurosawa, T. ; Tomono, A.
Author_Institution :
Toshiba Corp. Semicond. & Storage Products Co., Kawasaki, Japan
fYear :
2012
fDate :
10-12 Dec. 2012
Firstpage :
1
Lastpage :
4
Abstract :
The SiP enables an easy integration of different types of chip and can be manufactured with few technical innovations. Wafer thinning technologies are key to achieve the SiP. BSG and dicing processes are mechanical processes using diamond grits. These mechanical processes have a high productivity and a low cost as its merits; however, these processes damage such chip surfaces. We already proposed a novel wafer thinning process namely a dicing before grinding (DBG) and DBG + mirror finish process. After DBG process, Die Attach Film (DAF) is diced using a laser dicer. This process is low productivity and high cost. In this study, a novel DAF separation process; spraying a high-pressure air to the DAF has been developed. This novel process achieves high productivity and low cost. We arrived at best process condition to separate the DAF.
Keywords :
integrated circuit packaging; microassembling; separation; system-in-package; BSG; DAF separation process; DAF technology; DBG-mirror finish process; SiP; chip surface; diamond grits; dicing before grinding process; dicing process; die attach film separation technology; laser dicer; mechanical process; system-in-package; ultrathin chip; wafer thinning technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-2654-4
Type :
conf
DOI :
10.1109/ICSJ.2012.6523402
Filename :
6523402
Link To Document :
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