DocumentCode
2257839
Title
MRAM write error categorization with QCKBD
Author
Shimizu, Yuui ; Aikawa, Hisanori ; Hosotani, Keiji ; Shimomura, Naoharu ; Kai, Tadashi ; Ueda, Yoshihiro ; Asao, Yoshiaki ; Iwata, Yoshihisa ; Tsuchida, Kenji ; Ikegawa, Sumio ; Yoda, Hiroaki
Author_Institution
Toshiba Corp., Kawasaki
fYear
2006
fDate
2-4 Aug. 2006
Abstract
A new test pattern, quadruplet checker board (QCKBD), is proposed which enables to evaluate magnetic crosstalk from the neighbor write lines. At first, some conventional test patterns changing the write points were applied to categorize magnetic random access memory (MRAM) write errors. But magnetic crosstalk from the neighbor write lines could not be isolated by these conventional tests since magnetic crosstalk error was caused when the neighbor cell is written. Whereas the QCKBD results from 4Kb test vehicles show that magnetic crosstalk restricts the write margin. By changing the cell structure in order to suppress magnetic crosstalk, the write margin is improved from 3.3 to 7.3
Keywords
automatic test pattern generation; crosstalk; integrated circuit testing; magnetic storage; magnetoresistive devices; random-access storage; MRAM write error categorization; magnetic crosstalk; magnetic random access memory; neighbor write lines; quadruplet checker board; test pattern; write points; Commercialization; Crosstalk; Current supplies; Fluctuations; Magnetic fields; Magnetic tunneling; Random access memory; Testing; Vehicles; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design, and Testing, 2006. MTDT '06. 2006 IEEE International Workshop on
Conference_Location
Taipei
ISSN
1087-4852
Print_ISBN
0-7695-2572-5
Type
conf
DOI
10.1109/MTDT.2006.19
Filename
1654579
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