• DocumentCode
    2257839
  • Title

    MRAM write error categorization with QCKBD

  • Author

    Shimizu, Yuui ; Aikawa, Hisanori ; Hosotani, Keiji ; Shimomura, Naoharu ; Kai, Tadashi ; Ueda, Yoshihiro ; Asao, Yoshiaki ; Iwata, Yoshihisa ; Tsuchida, Kenji ; Ikegawa, Sumio ; Yoda, Hiroaki

  • Author_Institution
    Toshiba Corp., Kawasaki
  • fYear
    2006
  • fDate
    2-4 Aug. 2006
  • Abstract
    A new test pattern, quadruplet checker board (QCKBD), is proposed which enables to evaluate magnetic crosstalk from the neighbor write lines. At first, some conventional test patterns changing the write points were applied to categorize magnetic random access memory (MRAM) write errors. But magnetic crosstalk from the neighbor write lines could not be isolated by these conventional tests since magnetic crosstalk error was caused when the neighbor cell is written. Whereas the QCKBD results from 4Kb test vehicles show that magnetic crosstalk restricts the write margin. By changing the cell structure in order to suppress magnetic crosstalk, the write margin is improved from 3.3 to 7.3
  • Keywords
    automatic test pattern generation; crosstalk; integrated circuit testing; magnetic storage; magnetoresistive devices; random-access storage; MRAM write error categorization; magnetic crosstalk; magnetic random access memory; neighbor write lines; quadruplet checker board; test pattern; write points; Commercialization; Crosstalk; Current supplies; Fluctuations; Magnetic fields; Magnetic tunneling; Random access memory; Testing; Vehicles; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design, and Testing, 2006. MTDT '06. 2006 IEEE International Workshop on
  • Conference_Location
    Taipei
  • ISSN
    1087-4852
  • Print_ISBN
    0-7695-2572-5
  • Type

    conf

  • DOI
    10.1109/MTDT.2006.19
  • Filename
    1654579