DocumentCode :
2258029
Title :
An EOG Artifacts Correction Method Based on Subspace Independent Component Analysis
Author :
Da, Li ; Jin, Wu ; Jiacai, Zhang
Author_Institution :
Coll. of Inf. Sci. & Technol., Beijing Normal Univ., Beijing, China
fYear :
2010
fDate :
11-14 Dec. 2010
Firstpage :
127
Lastpage :
131
Abstract :
The ocular artifact correction based on Linear Combination and Regression method is widely used in electroencephalographic (EEG) processing. Its main idea is to subtract a fraction of the recorded electro oculography (EOG) from the EEG signal to remove the overlapped EOG noise from EEG. But traditional regression method ignored the EEG signals mixed in the recorded EOG, and thus the overcorrection process will lead to some EEG signal lost during the correction of EOG. This paper proposed a new method of EOG correction based on Subspace Independent Components Analysis (SICA) which considers the Bi-directionality between the EOG and the EEG signal. Here, the advanced model is used to reduce the EOG artifacts from the datasets of the simulate data and the EEG dataset from BCI competition IV. With the different evaluation standards and performance index, the commonly used regression methods and the modified method were compared, and results indicated that EOG is well removed from EEG signals by our modified methods.
Keywords :
brain-computer interfaces; electro-oculography; electroencephalography; independent component analysis; medical signal processing; regression analysis; source separation; BCI; EEG signal; EOG artifacts correction method; EOG noise; brain computer interface; electroencephalographic processing; electrooculography; linear combination method; overcorrection process; regression method; subspace independent component analysis; EEG; EOG correction; SICA;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence and Security (CIS), 2010 International Conference on
Conference_Location :
Nanning
Print_ISBN :
978-1-4244-9114-8
Electronic_ISBN :
978-0-7695-4297-3
Type :
conf
DOI :
10.1109/CIS.2010.35
Filename :
5696247
Link To Document :
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