Title :
Nonlinear effects of RF interference in SC circuits
Author :
Crovetti, Paolo S. ; Fiori, Franco
Author_Institution :
Dip. di Elettronica, Politecnico di Torino, Italy
fDate :
28 Aug.-2 Sept. 2005
Abstract :
In this paper, the nonlinear effects which are induced by radio-frequency interference (RFI) in switched capacitor (SC) circuits are investigated. In particular, high frequency distortion mechanisms in MOS switches are highlighted and predicted by a new analytical model. Such a model is employed in order to evaluate RFI-induced errors in a complex SC circuit and model predictions are compared with the results of time domain computer simulations.
Keywords :
MOS integrated circuits; circuit complexity; integrated circuit modelling; radiofrequency interference; switched capacitor networks; MOS switches; RF interference; RFI induced errors; SC circuits; high frequency distortion mechanism; nonlinear effects; radiofrequency interference; switched capacitor circuits; Analytical models; Electromagnetic interference; MOS capacitors; Nonlinear distortion; Predictive models; Radio frequency; Radiofrequency interference; Switched capacitor circuits; Switches; Switching circuits;
Conference_Titel :
Circuit Theory and Design, 2005. Proceedings of the 2005 European Conference on
Print_ISBN :
0-7803-9066-0
DOI :
10.1109/ECCTD.2005.1522987
