DocumentCode
2258060
Title
Cycle time reduction at Motorola´s ACT fab
Author
Janakiram, Mani
Author_Institution
Adv. Custom Technol., Motorola Inc., Mesa, AZ, USA
fYear
1996
fDate
12-14 Nov 1996
Firstpage
465
Lastpage
469
Abstract
This paper deals with the application of theory of constraints (TOC) and simulation to fab cycle time reduction at Motorola´s Advanced Custom Technologies (ACT) fab. The cycle time crossfunctional team with the goal of transferring technology rapidly, keeping in mind customer satisfaction, underwent training in the basic theory of constraints, performed benchmarking, developed custom cycle time reports and developed techniques to measure theoretical cycle time and used multiples of theoretical cycle time as a basis to compare the performance of the wafer fab´s actual cycle time (this metric is used in addition to the other fab metrics like, Turns/WIP for measuring the fab performance). Since ACT is a development fab, provision was made in the study, to include varied product mix, reentrant flows, optimized WIP, a typical hold in the process, etc. Engineering judgments coupled with simulation techniques were used to identify the constraints and these constraints were classified as physical and procedural and were treated accordingly by the team. The team evaluated each constraints and devised solutions based on TOC to reduce the fab cycle time
Keywords
integrated circuit manufacture; research and development management; simulation; technology transfer; Advanced Custom Technologies; Motorola ACT fab; cycle time crossfunctional team; cycle time reduction; development fab; optimized WIP; reentrant flows; simulation; theory of constraints; training; varied product mix; Circuits; Constraint theory; Logic devices; Manufacturing processes; Model driven engineering; Performance evaluation; Production; Research and development; Semiconductor device manufacture; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
0-7803-3371-3
Type
conf
DOI
10.1109/ASMC.1996.558121
Filename
558121
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