• DocumentCode
    2258060
  • Title

    Cycle time reduction at Motorola´s ACT fab

  • Author

    Janakiram, Mani

  • Author_Institution
    Adv. Custom Technol., Motorola Inc., Mesa, AZ, USA
  • fYear
    1996
  • fDate
    12-14 Nov 1996
  • Firstpage
    465
  • Lastpage
    469
  • Abstract
    This paper deals with the application of theory of constraints (TOC) and simulation to fab cycle time reduction at Motorola´s Advanced Custom Technologies (ACT) fab. The cycle time crossfunctional team with the goal of transferring technology rapidly, keeping in mind customer satisfaction, underwent training in the basic theory of constraints, performed benchmarking, developed custom cycle time reports and developed techniques to measure theoretical cycle time and used multiples of theoretical cycle time as a basis to compare the performance of the wafer fab´s actual cycle time (this metric is used in addition to the other fab metrics like, Turns/WIP for measuring the fab performance). Since ACT is a development fab, provision was made in the study, to include varied product mix, reentrant flows, optimized WIP, a typical hold in the process, etc. Engineering judgments coupled with simulation techniques were used to identify the constraints and these constraints were classified as physical and procedural and were treated accordingly by the team. The team evaluated each constraints and devised solutions based on TOC to reduce the fab cycle time
  • Keywords
    integrated circuit manufacture; research and development management; simulation; technology transfer; Advanced Custom Technologies; Motorola ACT fab; cycle time crossfunctional team; cycle time reduction; development fab; optimized WIP; reentrant flows; simulation; theory of constraints; training; varied product mix; Circuits; Constraint theory; Logic devices; Manufacturing processes; Model driven engineering; Performance evaluation; Production; Research and development; Semiconductor device manufacture; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-3371-3
  • Type

    conf

  • DOI
    10.1109/ASMC.1996.558121
  • Filename
    558121