Adapting to adaptive testing

Author

Marinissen, Erik Jan ; Singh, Adit ; Glotter, Dan ; Esposito, Marco ; Carulli, John M., Jr. ; Nahar, Amit ; Butler, Kenneth M. ; Appello, Davide ; Portelli, Chris

Author_Institution

IMEC vzw, Leuven, Belgium

fYear

2010

fDate

8-12 March 2010

Firstpage

556

Lastpage

561

Abstract

Adaptive testing is a generic term for a number of techniques which aim at improving the test quality and/or reducing the test application costs. In adaptive tests, the test content or pass/fail limits are not fixed as in conventional tests, but dependent on other test results of the currently or previously tested chips. Part-average testing, outlier detection, and neighborhood screening are just a few examples of adaptive testing. With this Embedded Tutorial, we are offering an introduction to this topic, which is hot in the test community, to the wider DATE audience.

Keywords

integrated circuit testing; adaptive testing; fail limit; neighborhood screening; outlier detection; part-average testing; pass limit; test application cost; test content; test quality; Circuit testing; Cost function; Instruments; Integrated circuit packaging; Integrated circuit testing; Microelectronics; Probes; Semiconductor device manufacture; Semiconductor device testing; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010

Conference_Location

Dresden

ISSN

1530-1591

Print_ISBN

978-1-4244-7054-9

Type

conf

DOI

10.1109/DATE.2010.5457143

Filename

5457143