DocumentCode :
2258126
Title :
Adapting to adaptive testing
Author :
Marinissen, Erik Jan ; Singh, Adit ; Glotter, Dan ; Esposito, Marco ; Carulli, John M., Jr. ; Nahar, Amit ; Butler, Kenneth M. ; Appello, Davide ; Portelli, Chris
Author_Institution :
IMEC vzw, Leuven, Belgium
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
556
Lastpage :
561
Abstract :
Adaptive testing is a generic term for a number of techniques which aim at improving the test quality and/or reducing the test application costs. In adaptive tests, the test content or pass/fail limits are not fixed as in conventional tests, but dependent on other test results of the currently or previously tested chips. Part-average testing, outlier detection, and neighborhood screening are just a few examples of adaptive testing. With this Embedded Tutorial, we are offering an introduction to this topic, which is hot in the test community, to the wider DATE audience.
Keywords :
integrated circuit testing; adaptive testing; fail limit; neighborhood screening; outlier detection; part-average testing; pass limit; test application cost; test content; test quality; Circuit testing; Cost function; Instruments; Integrated circuit packaging; Integrated circuit testing; Microelectronics; Probes; Semiconductor device manufacture; Semiconductor device testing; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457143
Filename :
5457143
Link To Document :
بازگشت