DocumentCode :
2258186
Title :
Measuring and compensating for process mismatch-induced, reference spurs in phase-locked loops using a sub-sampled DSP
Author :
Zhuo, Gao ; Kesharwani, Divya ; Chiang, Patrick ; Weiwu, Hu
Author_Institution :
Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing, China
fYear :
2009
fDate :
24-27 May 2009
Firstpage :
1585
Lastpage :
1588
Abstract :
A DSP method based on sub-sampling followed by M-point FFT of the sub-sampled signal is used to reduce the phase-locked loop´s reference spur. To validate the system´s effectiveness a digital calibration loop in SIMULINK is designed. The results show that the reference spur can be improved by 22 dBc with a 1% residual current mismatch and a 1 nA net value of leakage current.
Keywords :
calibration; digital signal processing chips; fast Fourier transforms; leakage currents; phase locked loops; signal sampling; M-point FFT; PLL reference spur reduction; SIMULINK; current 1 nA; digital calibration loop; digital signal processing; phase-locked loop; subsampled DSP method; subsampled signal; Charge pumps; Circuit optimization; Clocks; Digital signal processing; Leakage current; Phase frequency detector; Phase locked loops; Phase measurement; Tuning; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3827-3
Electronic_ISBN :
978-1-4244-3828-0
Type :
conf
DOI :
10.1109/ISCAS.2009.5118073
Filename :
5118073
Link To Document :
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