DocumentCode
2258204
Title
Temperature compensation in combination selection based mismatch calibration
Author
Marku, Joona ; Poikonen, Jonne ; Paasio, Ari
Author_Institution
Dept. of Inf. Technol., Univ. of Turku, Turku, Finland
fYear
2009
fDate
24-27 May 2009
Firstpage
1589
Lastpage
1592
Abstract
The temperature behaviour of a combination selection based mismatch calibration is discussed. The functionality of the calibration structure has already been presented. Clear benefits in implementation area and accuracy can be reached when using mismatch calibration based on combination selection of minimum-sized transistors. However, with the used high accuracy requirements, the effects of temperature must be taken into the account. Temperature compensation circuitry for combination selection based mismatch calibration is developed, designed and simulated. The new temperature compensated and mismatch calibrated current source achieves 99% accuracy in 4sigma confidence over the temperature range of 30 degrees in centigrade. This range can still be extended by recalibrating the current source in intervals of 15 degrees in centigrade.
Keywords
analogue circuits; compensation; transistor circuits; calibration structure; minimum-sized transistors; mismatch calibration; temperature compensation; temperature compensation circuitry; Calibration; Circuit optimization; Circuit simulation; Counting circuits; Current measurement; Information technology; Laboratories; Microelectronics; Signal processing; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4244-3827-3
Electronic_ISBN
978-1-4244-3828-0
Type
conf
DOI
10.1109/ISCAS.2009.5118074
Filename
5118074
Link To Document