• DocumentCode
    2258204
  • Title

    Temperature compensation in combination selection based mismatch calibration

  • Author

    Marku, Joona ; Poikonen, Jonne ; Paasio, Ari

  • Author_Institution
    Dept. of Inf. Technol., Univ. of Turku, Turku, Finland
  • fYear
    2009
  • fDate
    24-27 May 2009
  • Firstpage
    1589
  • Lastpage
    1592
  • Abstract
    The temperature behaviour of a combination selection based mismatch calibration is discussed. The functionality of the calibration structure has already been presented. Clear benefits in implementation area and accuracy can be reached when using mismatch calibration based on combination selection of minimum-sized transistors. However, with the used high accuracy requirements, the effects of temperature must be taken into the account. Temperature compensation circuitry for combination selection based mismatch calibration is developed, designed and simulated. The new temperature compensated and mismatch calibrated current source achieves 99% accuracy in 4sigma confidence over the temperature range of 30 degrees in centigrade. This range can still be extended by recalibrating the current source in intervals of 15 degrees in centigrade.
  • Keywords
    analogue circuits; compensation; transistor circuits; calibration structure; minimum-sized transistors; mismatch calibration; temperature compensation; temperature compensation circuitry; Calibration; Circuit optimization; Circuit simulation; Counting circuits; Current measurement; Information technology; Laboratories; Microelectronics; Signal processing; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3827-3
  • Electronic_ISBN
    978-1-4244-3828-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2009.5118074
  • Filename
    5118074