DocumentCode :
2258283
Title :
Power gating design for standard-cell-like structured ASICs
Author :
Chen, Sin-Yu ; Lin, Rung-Bin ; Tung, Hui-Hsiang ; Lin, Kuen-Wey
Author_Institution :
Comput. Sci. & Eng. Line, Yuan Ze Univ., Chungli, Taiwan
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
514
Lastpage :
519
Abstract :
Structured ASIC has been introduced to bridge the power, performance, area and design cost gaps between ASIC and FPGA. As technology scales, leakage power consumption becomes a serious problem. Among the leakage power reduction techniques, power gating is commonly used to disconnect idle logic blocks from power network to curtail sub-threshold leakage. In this paper, we apply power gating to structured ASICs for leakage power reduction. We present a power-gated via-configurable logic block (PGVCLB) and a power gated design flow mostly using existing standard cell design tools. We can configure PGVCLBs in a design to implement fine-grained power gating, coarse-grained/cluster-based power gating or even distributed sleep transistor network (DSTN). With fine-grained power gating, we can achieve 52% leakage reduction on average with only 8% area and 17% delay overheads when compared to the data obtained using a non-power-gated library.
Keywords :
application specific integrated circuits; field programmable gate arrays; logic design; FPGA; application specific integrated circuits; coarse-grained/cluster-based power gating; distributed sleep transistor network; fine-grained power gating; idle logic blocks; leakage power consumption; leakage power reduction techniques; power gating design; power network; power-gated via-configurable logic block; standard cell design tools; standard-cell-like structured ASIC; sub-threshold leakage; Application specific integrated circuits; Costs; Delay; Field programmable gate arrays; Libraries; Logic arrays; Logic design; Power engineering and energy; Sleep; Voltage; low power; power-gating; structured ASIC; via-configurable;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457152
Filename :
5457152
Link To Document :
بازگشت