• DocumentCode
    2258307
  • Title

    DEW: A fast level 1 cache simulation approach for embedded processors with FIFO replacement policy

  • Author

    Haque, Mohammad Shihabul ; Peddersen, Jorgen ; Janapsatya, Andhi ; Parameswaran, Sri

  • Author_Institution
    Univ. of New South Wales, Sydney, NSW, Australia
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    496
  • Lastpage
    501
  • Abstract
    Increasing the speed of cache simulation to obtain hit/miss rates enables performance estimation, cache exploration for embedded systems and energy estimation. Previously, such simulations, particularly exact approaches, have been exclusively for caches which utilize the least recently used (LRU) replacement policy. In this paper, we propose a new, fast and exact cache simulation method for the First In First Out(FIFO) replacement policy. This method, called DEW, is able to simulate multiple level 1 cache configurations (different set sizes, associativities, and block sizes) with FIFO replacement policy. DEW utilizes a binomial tree based representation of cache configurations and a novel searching method to speed up simulation over single cache simulators like Dinero IV. Depending on different cache block sizes and benchmark applications, DEW operates around 8 to 40 times faster than Dinero IV. Dinero IV compares 2.17 to 19.42 times more cache ways than DEW to determine accurate miss rates.
  • Keywords
    cache storage; circuit simulation; embedded systems; microprocessor chips; tree searching; DEW; Dinero IV; FIFO replacement policy; LRU replacement policy; binomial tree based representation; embedded processor system; energy estimation; fast level 1 cache simulation approach; first in first out replacement policy; searching method; Analytical models; Application specific processors; Australia; Cache memory; Computer aided instruction; Costs; Embedded system; Energy consumption; Process design; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457153
  • Filename
    5457153