DocumentCode
2258307
Title
DEW: A fast level 1 cache simulation approach for embedded processors with FIFO replacement policy
Author
Haque, Mohammad Shihabul ; Peddersen, Jorgen ; Janapsatya, Andhi ; Parameswaran, Sri
Author_Institution
Univ. of New South Wales, Sydney, NSW, Australia
fYear
2010
fDate
8-12 March 2010
Firstpage
496
Lastpage
501
Abstract
Increasing the speed of cache simulation to obtain hit/miss rates enables performance estimation, cache exploration for embedded systems and energy estimation. Previously, such simulations, particularly exact approaches, have been exclusively for caches which utilize the least recently used (LRU) replacement policy. In this paper, we propose a new, fast and exact cache simulation method for the First In First Out(FIFO) replacement policy. This method, called DEW, is able to simulate multiple level 1 cache configurations (different set sizes, associativities, and block sizes) with FIFO replacement policy. DEW utilizes a binomial tree based representation of cache configurations and a novel searching method to speed up simulation over single cache simulators like Dinero IV. Depending on different cache block sizes and benchmark applications, DEW operates around 8 to 40 times faster than Dinero IV. Dinero IV compares 2.17 to 19.42 times more cache ways than DEW to determine accurate miss rates.
Keywords
cache storage; circuit simulation; embedded systems; microprocessor chips; tree searching; DEW; Dinero IV; FIFO replacement policy; LRU replacement policy; binomial tree based representation; embedded processor system; energy estimation; fast level 1 cache simulation approach; first in first out replacement policy; searching method; Analytical models; Application specific processors; Australia; Cache memory; Computer aided instruction; Costs; Embedded system; Energy consumption; Process design; System performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457153
Filename
5457153
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