• DocumentCode
    2258345
  • Title

    GaN/AlGaN HEMT microwave class-E power amplifier

  • Author

    Islam, Syed S. ; Anwar, A.F.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Connecticut Univ., Storrs, CT, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    446
  • Lastpage
    449
  • Abstract
    We report the first GaN/AlGaN microwave class-E power amplifier. A physics-based nonlinear model of the GaN/AlGaN HEMT is used instead of the switching models of the active device considered in previous works. The expressions of load network components of the class-E amplifier are derived considering exponential decay of the drain current during fall time and finite quality factor of the resonant circuit to incorporate the nonidealities of the active device and passive components. The class-E amplifier has been simulated using the Cadence circuit simulator using different HEMT structures. Calculated output power and power conversion efficiency are 93 mW and 72% at 1 GHz that decreases to 69 mW and 68% at 11 GHz, respectively for a 1 μm×150 μm GaN/Al0.25Ga0.75N HEMT. For a 0.12 μm×100 μm GaN/Al0.20Ga0.80N HEMT the corresponding quantities are 131 mW, 82%, 87 mW and 77%, respectively
  • Keywords
    III-V semiconductors; SPICE; aluminium compounds; digital simulation; gallium compounds; microwave field effect transistors; microwave power amplifiers; power HEMT; semiconductor device models; wide band gap semiconductors; 0.12 micron; 1 GHz; 1 micron; 100 micron; 11 GHz; 131 mW; 150 micron; 68 percent; 69 mW; 72 percent; 77 percent; 82 percent; 87 mW; 93 mW; Cadence circuit simulator; GaN-AlGaN; GaN/AlGaN HEMT microwave class-E power amplifier; active device; drain current exponential decay; finite quality factor; load network components; output power; passive components; physics-based nonlinear model; power conversion efficiency; resonant circuit; Aluminum gallium nitride; Circuit simulation; Gallium nitride; HEMTs; Microwave amplifiers; Microwave devices; Power amplifiers; Power generation; Q factor; RLC circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2001 International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7432-0
  • Type

    conf

  • DOI
    10.1109/ISDRS.2001.984541
  • Filename
    984541