Title :
Nondestructive defect analysis solution using combination of Lock-in IR thermography and high resolution X-ray CT technology
Author_Institution :
Marubun Corp., Tokyo, Japan
Abstract :
We developed the non-destructive failure analysis method that is combination of Lock-in IR thermography and 3D oblique CT. It made possible to complete the total analysis efficiently because we are able to distinguish the failure mode by non-destructive method.
Keywords :
computerised tomography; failure analysis; infrared imaging; nondestructive testing; 3D oblique CT; high-resolution X-ray CT technology; lock-in IR thermography; nondestructive defect analysis; nondestructive failure analysis method;
Conference_Titel :
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-2654-4
DOI :
10.1109/ICSJ.2012.6523426
