DocumentCode
2258374
Title
Efficient decision ordering techniques for SAT-based test generation
Author
Chen, Mingsong ; Qin, Xiaoke ; Mishra, Prabhat
Author_Institution
Dept. of Comput. & Inf. Sci. & Eng., Univ. of Florida, Gainesville, FL, USA
fYear
2010
fDate
8-12 March 2010
Firstpage
490
Lastpage
495
Abstract
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model checking techniques do not scale well when checking complex designs. In SAT-based BMC, many variable ordering heuristics have been investigated to improve counterexample (test) generation involving only one property. This paper presents efficient decision ordering techniques that can improve the overall test generation time of a cluster of similar properties. Our method exploits the assignments of previously generated tests and incorporates it in the decision ordering heuristic for current test generation. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically reduce the overall test generation time.
Keywords
automatic test pattern generation; electronic engineering computing; formal verification; SAT-based BMC; SAT-based test generation; bounded model checking technique; decision ordering technique; Automatic testing; Benchmark testing; Explosions; Hardware; Humans; Information science; Search problems; Software testing; State-space methods; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457156
Filename
5457156
Link To Document