DocumentCode :
2258374
Title :
Efficient decision ordering techniques for SAT-based test generation
Author :
Chen, Mingsong ; Qin, Xiaoke ; Mishra, Prabhat
Author_Institution :
Dept. of Comput. & Inf. Sci. & Eng., Univ. of Florida, Gainesville, FL, USA
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
490
Lastpage :
495
Abstract :
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model checking techniques do not scale well when checking complex designs. In SAT-based BMC, many variable ordering heuristics have been investigated to improve counterexample (test) generation involving only one property. This paper presents efficient decision ordering techniques that can improve the overall test generation time of a cluster of similar properties. Our method exploits the assignments of previously generated tests and incorporates it in the decision ordering heuristic for current test generation. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically reduce the overall test generation time.
Keywords :
automatic test pattern generation; electronic engineering computing; formal verification; SAT-based BMC; SAT-based test generation; bounded model checking technique; decision ordering technique; Automatic testing; Benchmark testing; Explosions; Hardware; Humans; Information science; Search problems; Software testing; State-space methods; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457156
Filename :
5457156
Link To Document :
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