• DocumentCode
    2258374
  • Title

    Efficient decision ordering techniques for SAT-based test generation

  • Author

    Chen, Mingsong ; Qin, Xiaoke ; Mishra, Prabhat

  • Author_Institution
    Dept. of Comput. & Inf. Sci. & Eng., Univ. of Florida, Gainesville, FL, USA
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    490
  • Lastpage
    495
  • Abstract
    Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model checking techniques do not scale well when checking complex designs. In SAT-based BMC, many variable ordering heuristics have been investigated to improve counterexample (test) generation involving only one property. This paper presents efficient decision ordering techniques that can improve the overall test generation time of a cluster of similar properties. Our method exploits the assignments of previously generated tests and incorporates it in the decision ordering heuristic for current test generation. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically reduce the overall test generation time.
  • Keywords
    automatic test pattern generation; electronic engineering computing; formal verification; SAT-based BMC; SAT-based test generation; bounded model checking technique; decision ordering technique; Automatic testing; Benchmark testing; Explosions; Hardware; Humans; Information science; Search problems; Software testing; State-space methods; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457156
  • Filename
    5457156