Title :
VLSI nano-scale interconnect induced crosstalk power estimation
Author :
Seyedolhosseini, Atefesadat ; Masoumi, Nasser ; Mehri, Milad
Author_Institution :
Adv. VLSI Lab., Univ. of Tehran, Tehran, Iran
Abstract :
In this paper output transfer function for two RLC interconnects considering capacitive and inductive coupling is extracted. Sufficient number of lumped elements is employed to verify the method. The novelty of this work is separation of energy consumed by victim and aggressor. A new method is presented to estimate the dissipated energy due to the crosstalk effect. Energy is estimated using output waveform and there is no need to use the conventional formulas. A suitable way to calculate interconnects dissipated energy by a well-known formula against the conventional methods is proposed with lower value of error that can be used for both aggressor and victim line.
Keywords :
VLSI; integrated circuit interconnections; integrated circuit noise; VLSI nanoscale interconnect induced crosstalk power estimation; capacitive coupling; crosstalk effect; inductive coupling; output transfer function; two RLC interconnects;
Conference_Titel :
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-2654-4
DOI :
10.1109/ICSJ.2012.6523435