• DocumentCode
    2258598
  • Title

    Circuit propagation delay estimation through multivariate regression-based modeling under spatio-temporal variability

  • Author

    Ganapathy, Shrikanth ; Canal, Ramon ; Gonzalez, Antonio ; Rubio, Antonio

  • Author_Institution
    Dept. d´´Arquit. de Comput., Univ. Politec. de Catalunya, Barcelona, Spain
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    417
  • Lastpage
    422
  • Abstract
    With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits. Propagation delays which decide circuit performance are likely to suffer the most from this phenomena. While Statistical static timing analysis (SSTA) is used extensively for this purpose, it does not account for dynamic conditions during operation. In this paper, we present a multivariate regression based technique that computes the propagation delay of circuits subject to manufacturing process variations in the presence of temporal variations like temperature. It can be used to predict the dynamic behavior of circuits under changing operating conditions. The median error between the proposed model and circuit-level simulations is below 5%. With this model, we ran a study of the effect of temperature on access time delays for 500 cache samples. The study was run in 0.557 seconds, compared to the 20h and 4min of the SPICE simulation achieving a speedup of over 1??105. As a case study, we show that the access times of caches can vary as much as 2.03?? at high temperatures in future technologies under process variations.
  • Keywords
    cache storage; delays; integrated circuit modelling; regression analysis; timing; SPICE simulation; cache access time; circuit propagation delay estimation; circuit-level simulations; multivariate regression; process generation; process variations; spatio-temporal variability; statistical static timing analysis; Circuit optimization; Circuit simulation; Computational modeling; Computer aided manufacturing; Delay estimation; Manufacturing processes; Multivariate regression; Propagation delay; Temperature; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457167
  • Filename
    5457167