DocumentCode
2258598
Title
Circuit propagation delay estimation through multivariate regression-based modeling under spatio-temporal variability
Author
Ganapathy, Shrikanth ; Canal, Ramon ; Gonzalez, Antonio ; Rubio, Antonio
Author_Institution
Dept. d´´Arquit. de Comput., Univ. Politec. de Catalunya, Barcelona, Spain
fYear
2010
fDate
8-12 March 2010
Firstpage
417
Lastpage
422
Abstract
With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits. Propagation delays which decide circuit performance are likely to suffer the most from this phenomena. While Statistical static timing analysis (SSTA) is used extensively for this purpose, it does not account for dynamic conditions during operation. In this paper, we present a multivariate regression based technique that computes the propagation delay of circuits subject to manufacturing process variations in the presence of temporal variations like temperature. It can be used to predict the dynamic behavior of circuits under changing operating conditions. The median error between the proposed model and circuit-level simulations is below 5%. With this model, we ran a study of the effect of temperature on access time delays for 500 cache samples. The study was run in 0.557 seconds, compared to the 20h and 4min of the SPICE simulation achieving a speedup of over 1??105. As a case study, we show that the access times of caches can vary as much as 2.03?? at high temperatures in future technologies under process variations.
Keywords
cache storage; delays; integrated circuit modelling; regression analysis; timing; SPICE simulation; cache access time; circuit propagation delay estimation; circuit-level simulations; multivariate regression; process generation; process variations; spatio-temporal variability; statistical static timing analysis; Circuit optimization; Circuit simulation; Computational modeling; Computer aided manufacturing; Delay estimation; Manufacturing processes; Multivariate regression; Propagation delay; Temperature; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457167
Filename
5457167
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