DocumentCode
2258790
Title
Automatic workload generation for system-level exploration based on modified GCC compiler
Author
Kreku, Jari ; Tiensyrjä, Kari ; Vanmeerbeeck, Geert
Author_Institution
VTT Tech. Res. Center of Finland, Oulu, Finland
fYear
2010
fDate
8-12 March 2010
Firstpage
369
Lastpage
374
Abstract
Future embedded system products, e.g. smart hand-held mobile terminals, will accommodate a large number of applications that will partly run sequentially and independently, partly concurrently and interacting on massively parallel computing platforms. Already for systems of moderate complexity, the design space will be huge and its exploration requires that the system architect is able to quickly evaluate the performances of candidate architectures and application mappings. The mainstream evaluation technique today is the system-level performance simulation of the applications and platforms using abstracted workload and processing capacity models, respectively. These virtual system models allow fast simulation of large systems at an early phase of development with reasonable modeling effort and time. The accuracy of the performance results is dependent on how closely the models used reflect the actual system. This paper presents a compiler based technique for automatic generation of workload models for performance simulation, while exploiting an overall approach and platform performance capacity models developed previously. The resulting workload models are experimented using x264 video and JPEG encoding application examples.
Keywords
embedded systems; program compilers; application mapping; automatic generation; automatic workload generation; compiler based technique; design space; embedded system; modified GCC compiler; system level exploration; system-level performance simulation; virtual system model; Abstracts; Application software; Computational modeling; Computer architecture; Delay; Embedded system; Encoding; Mobile computing; Performance evaluation; Processor scheduling;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457175
Filename
5457175
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