DocumentCode :
2258968
Title :
A new approach for adaptive failure diagnostics based on emulation test
Author :
Ostendorff, S. ; Wuttke, H.-D. ; Sachsse, J. ; Köhler, S.
Author_Institution :
Integrated Hard- & Software Syst. Group, Ilmenau Univ. of Technol., Ilmenau, Germany
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
327
Lastpage :
330
Abstract :
The paper describes a new approach of boundary scan emulation based testing for adaptive failure diagnostics using programmable logic. The motivation to speed up boundary scan based testing as well as the approach taken for this new concept and architecture are presented. With this approach the possibilities of boundary scan testing can be extended by using the available on-board resources for a faster and more real-time oriented test. The new options and benefits, as well as the necessary fundamentals of this approach are indicated. An example and first test results are given as well, to indicate the advantage of the proposed system.
Keywords :
boundary scan testing; failure analysis; integrated circuit testing; programmable logic devices; real-time systems; adaptive failure diagnostics; boundary scan emulation based testing; on-board resources; programmable logic; real-time oriented test; Automatic testing; Circuit testing; Electronic equipment testing; Emulation; Field programmable gate arrays; Frequency; Logic testing; Programmable logic arrays; Software testing; System testing; adaptive systems; automatic test equipment; boundary scan testing; field programmable gate arrays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457183
Filename :
5457183
Link To Document :
بازگشت