Title :
A systematic approach to the test of combined HW/SW systems
Author :
Krupp, Alexander ; Müller, Wolfgang
Author_Institution :
C-Lab., Paderborn Univ., Paderborn, Germany
Abstract :
Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition.
Keywords :
embedded systems; formal specification; hardware-software codesign; integrated circuit testing; HW/SW systems; classification tree method; continuous acceptance criteria; continuous control systems; embedded systems; functional coverage definition; requirement specification; systematic approach; test environment; Automatic testing; Automotive engineering; Classification tree analysis; Control systems; Electronic equipment testing; Embedded system; Mathematical model; Object oriented modeling; Software testing; System testing;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5457186
