DocumentCode
2259155
Title
3D system simulation study of power integrity using Si interposer with distribution TSV decoupling capacitors
Author
Kohno, Kenta ; Kitamura, Yoshifumi ; Kamada, Tomonari ; Ohara, J. ; Akiyama, Yoko ; Ueda, Chihiro ; Otsuka, Kanji
Author_Institution
Meisei Univ. Collaborative Res. Center, Hino, Japan
fYear
2012
fDate
10-12 Dec. 2012
Firstpage
1
Lastpage
4
Abstract
Improvements of power integrity (PI) on high-speed system have been studied from the point view of many structures in huge papers[1][2][3]. In this study, the PI simulation for the A-D mixed 3D stack chip system by TSV is done in many kinds of power sources. We already studied on the interposer with large area MIM capacitor was effective for the 3D system [4][5], that understood as an area structure made lower input impedance ever GHz region. As a result, we can find which the input impedance is related largely with the DeCap TSV distribution pitch. Consideration of approach wiring to distributed DeCap TSVs is the key issue for the better PI performance as the result.
Keywords
capacitors; three-dimensional integrated circuits; 3D system simulation; DeCap TSV distribution pitch; PI performance; distributed DeCap TSV; distribution TSV decoupling capacitor; high speed system; mixed 3D stack chip system; power integrity; power sources; silicon interposer;
fLanguage
English
Publisher
ieee
Conference_Titel
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location
Kyoto
Print_ISBN
978-1-4673-2654-4
Type
conf
DOI
10.1109/ICSJ.2012.6523458
Filename
6523458
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