• DocumentCode
    2259155
  • Title

    3D system simulation study of power integrity using Si interposer with distribution TSV decoupling capacitors

  • Author

    Kohno, Kenta ; Kitamura, Yoshifumi ; Kamada, Tomonari ; Ohara, J. ; Akiyama, Yoko ; Ueda, Chihiro ; Otsuka, Kanji

  • Author_Institution
    Meisei Univ. Collaborative Res. Center, Hino, Japan
  • fYear
    2012
  • fDate
    10-12 Dec. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Improvements of power integrity (PI) on high-speed system have been studied from the point view of many structures in huge papers[1][2][3]. In this study, the PI simulation for the A-D mixed 3D stack chip system by TSV is done in many kinds of power sources. We already studied on the interposer with large area MIM capacitor was effective for the 3D system [4][5], that understood as an area structure made lower input impedance ever GHz region. As a result, we can find which the input impedance is related largely with the DeCap TSV distribution pitch. Consideration of approach wiring to distributed DeCap TSVs is the key issue for the better PI performance as the result.
  • Keywords
    capacitors; three-dimensional integrated circuits; 3D system simulation; DeCap TSV distribution pitch; PI performance; distributed DeCap TSV; distribution TSV decoupling capacitor; high speed system; mixed 3D stack chip system; power integrity; power sources; silicon interposer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    CPMT Symposium Japan, 2012 2nd IEEE
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4673-2654-4
  • Type

    conf

  • DOI
    10.1109/ICSJ.2012.6523458
  • Filename
    6523458