DocumentCode
2259182
Title
An RDL-configurable 3D memory tier to replace on-chip SRAM
Author
Facchini, Marco ; Marchal, Pol ; Catthoor, Francky ; Dehaene, Wim
Author_Institution
IMEC-Interuniversity Microelectron. Center, Heverlee, Belgium
fYear
2010
fDate
8-12 March 2010
Firstpage
291
Lastpage
294
Abstract
In a conventional SoC designs, on-chip memories occupy more than the 50% of the total die area. 3D technology enables the distribution of logic and memories on separate stacked dies (tiers). This allows redesigning the memory tier as a configurable product to be used in multiple system designs. Previously proposed dynamic re-configurable solutions demonstrate strong dependence between read latency and dimensions of the mapped memory, leading to potential performance limitations. In this paper we propose a one-time configurable memory tier designed to minimize the performances overhead due to the commodity. Flexible configuration is enabled by smart memory macros and I/Os organization and a customizable redistribution layer routing. With respect to the dynamic re-configurability, the proposed design offers up to 40% faster access time, while saving more than 10% of energy per access. In addition production cost trade offs are analyzed.
Keywords
SRAM chips; integrated circuit design; logic design; memory architecture; system-on-chip; 3D technology; I/O organization; RDL-configurable 3D memory tier; SoC design; customizable redistribution layer routing; dynamic reconfigurability; on-chip SRAM; on-chip memory; one-time configurable memory tier design; smart memory macros; stacked dies; stacked tier; Costs; Delay; HDTV; Logic design; Manufacturing; Merging; Microelectronics; Production; Random access memory; Routing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457194
Filename
5457194
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