• DocumentCode
    2259182
  • Title

    An RDL-configurable 3D memory tier to replace on-chip SRAM

  • Author

    Facchini, Marco ; Marchal, Pol ; Catthoor, Francky ; Dehaene, Wim

  • Author_Institution
    IMEC-Interuniversity Microelectron. Center, Heverlee, Belgium
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    291
  • Lastpage
    294
  • Abstract
    In a conventional SoC designs, on-chip memories occupy more than the 50% of the total die area. 3D technology enables the distribution of logic and memories on separate stacked dies (tiers). This allows redesigning the memory tier as a configurable product to be used in multiple system designs. Previously proposed dynamic re-configurable solutions demonstrate strong dependence between read latency and dimensions of the mapped memory, leading to potential performance limitations. In this paper we propose a one-time configurable memory tier designed to minimize the performances overhead due to the commodity. Flexible configuration is enabled by smart memory macros and I/Os organization and a customizable redistribution layer routing. With respect to the dynamic re-configurability, the proposed design offers up to 40% faster access time, while saving more than 10% of energy per access. In addition production cost trade offs are analyzed.
  • Keywords
    SRAM chips; integrated circuit design; logic design; memory architecture; system-on-chip; 3D technology; I/O organization; RDL-configurable 3D memory tier; SoC design; customizable redistribution layer routing; dynamic reconfigurability; on-chip SRAM; on-chip memory; one-time configurable memory tier design; smart memory macros; stacked dies; stacked tier; Costs; Delay; HDTV; Logic design; Manufacturing; Merging; Microelectronics; Production; Random access memory; Routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457194
  • Filename
    5457194