Title :
Requirements for ultra-thin-film devices and new materials on CMOS roadmap
Author :
Fenouillet-Berange, C. ; Skotnicki, T. ; Monfray, S. ; Carriere, N. ; Boeuf, F.
Author_Institution :
LETI, CEA, Grenoble, France
fDate :
29 Sept.-2 Oct. 2003
Abstract :
For the first time various devices architectures (Bulk, SOI and SON) and process modules (metal gate, strained-Si channel) are compared a consistent way using the same analytical tool. This analysis shows on one hand that the conventional Bulk cannot match the requirements throughout the entire ITRS´01 roadmap, but on the other hand it gives clear guidelines on device architectures permitting to do so. In other words, this paper puts forward a device architecture roadmap and shows precisely which architectures, modules and materials will be needed at a given CMOS node. This message analysis may be of importance for semiconductor manufacturer, equipment makers and SOI wafer providers.
Keywords :
MOSFET; elemental semiconductors; modules; semiconductor device models; semiconductor thin films; silicon; silicon-on-insulator; thin film devices; CMOS roadmap; SOI wafer providers; Si; device architecture; metal gate; modules; semiconductor manufacturing; strained-Si channel; ultrathin-film devices; MOSFETs; Semiconductor device modeling; Semiconductor films; Silicon; Silicon on insulator technology; Thin film devices;
Conference_Titel :
SOI Conference, 2003. IEEE International
Print_ISBN :
0-7803-7815-6
DOI :
10.1109/SOI.2003.1242930