DocumentCode :
2259382
Title :
Automatic evaluation of translation quality using expanded N-gram co-occurrence
Author :
Qin, Ying ; Wen, Qiufang ; Wang, Jinquan
Author_Institution :
Nat. Res. Centre for Foreign Language Educ., Beijing Foreign Studies Univ., Beijing, China
fYear :
2009
fDate :
24-27 Sept. 2009
Firstpage :
1
Lastpage :
5
Abstract :
BLEU and NIST as official machine translation evaluation metrics are widely used to assess system translation quality. These n-gram co-occurrence algorithms are applied to evaluate language learners´ translations in this paper. Subtle differences of evaluation on machine translation and learners´ translation are discussed. Dependent on n-gram matching between target translation and references, BLEU and NIST evaluate translation quality completely disregarding the source language. Based on sense overlapping in original language, we make pseudo translations for BLEU and NIST by substituting words or phrases in target translation for synonymous words and phrases in references. Pseudo translations expand n-gram co-occurrence between target translation and references. Evaluation experiments on learners´ translation and machine translation corpus with expanded n-gram co-occurrence outperform pure BLEU and NIST evaluation in higher correlation with human assessments.
Keywords :
computer based training; language translation; linguistics; pattern matching; language learner translation; learner selftraining; machine translation automatic evaluation metrics; n-gram cooccurrence; n-gram matching; pseudo translation; student translation; translation quality; Automatic testing; Dictionaries; Feedback; Humans; NIST; Performance evaluation; Stochastic processes; System performance; Machine translation evaluation; learners´ translation evaluation; n-gram co-occurrence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Natural Language Processing and Knowledge Engineering, 2009. NLP-KE 2009. International Conference on
Conference_Location :
Dalian
Print_ISBN :
978-1-4244-4538-7
Electronic_ISBN :
978-1-4244-4540-0
Type :
conf
DOI :
10.1109/NLPKE.2009.5313751
Filename :
5313751
Link To Document :
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