DocumentCode
2259454
Title
An Extended Phase Detector 2.56/3.2Gb/s Clock And Data Recovery design with Digitally Assisted Lock Detector
Author
Chen, Fan-Ta ; Wu, Jen-Ming
Author_Institution
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2009
fDate
24-27 May 2009
Firstpage
1831
Lastpage
1834
Abstract
In the paper, a novel 2.56/3.2Gb/s full-rate phase detector is developed for integration with clock data recovery (CDR) circuit in high speed SerDes applications. An extended phase detector (EPD) circuit is proposed to replace the full-rate Hogge architecture. To incorporate a LC-tank voltage control oscillator with cross-coupled pair and a differential charge pump with common mode feedback. The digitally assisted lock detector (DALD) circuitry provides a timing decision for switching dual loops between phase or frequency detector in the 6MR circuits. The CDR circuit is fabricated in a 0.18 mum 1P6M standard CMOS process in an area of 0.8times1.0 mm2. This CDR chip exhibits a low jitter performance of 2.12 ps RMS in the recovered clock and a BER is 3.5 times 10-9 with PRBS of 231-1 sequence. The power consumption is 136 mW with a 1.8 V supply at 3.2 Gb/s.
Keywords
CMOS integrated circuits; charge pump circuits; clock and data recovery circuits; clocks; error statistics; phase detectors; voltage-controlled oscillators; 1P6M standard CMOS process; BER; LC-tank voltage control oscillator; bit rate 2.56 Gbit/s; bit rate 3.2 Gbit/s; clock and data recovery design; common mode feedback; differential charge pump; digital assisted lock detector; error statistics; extended phase detector; extended phase detector circuit; frequency detector; full-rate Hogge architecture; full-rate phase detector; power 136 mW; power consumption; size 0.18 mum; voltage 1.8 V; CMOS process; Charge pumps; Clocks; Feedback; Phase detection; Phase frequency detector; Switching circuits; Timing; Voltage control; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4244-3827-3
Electronic_ISBN
978-1-4244-3828-0
Type
conf
DOI
10.1109/ISCAS.2009.5118134
Filename
5118134
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