Title :
Impact of photodetector nonlinearities on photonic analog-to-digital converters
Author :
Juodawlkis, P.W. ; Hargreaves, J.J. ; Twichell, J.C.
Author_Institution :
Lincoln Lab., MIT, Lexington, MA, USA
Abstract :
Summary from only given. Photodetector nonlinearities can limit the performance of high-dynamic-range analog optical systems. For systems that use short optical pulses to process or transmit analog information, this limitation is magnified due to the higher peak intensity at the photodetector input. In this paper, we examine the trade-off between signal-to-noise ratio (SNR) and linearity in optically sampled analog-to-digital converters (ADCs) due to saturation of the photodetector responsivity.
Keywords :
analogue-digital conversion; optical communication equipment; optical noise; optical saturation; photodetectors; high-dynamic-range analog optical systems; optically sampled analog-to-digital converters; peak intensity; photodetector input; photodetector nonlinearities; photodetector responsivity saturation; photonic analog-to-digital converters; short optical pulses; signal-to-noise ratio; Analog-digital conversion; Bandwidth; Delay; Electrooptical waveguides; Microwave devices; Optical pulses; PIN photodiodes; Photodetectors; Pulse measurements; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1033368
