Impact of photodetector nonlinearities on photonic analog-to-digital converters

Author

Juodawlkis, P.W. ; Hargreaves, J.J. ; Twichell, J.C.

Author_Institution

Lincoln Lab., MIT, Lexington, MA, USA

fYear

2002

fDate

24-24 May 2002

Firstpage

11

Abstract

Summary from only given. Photodetector nonlinearities can limit the performance of high-dynamic-range analog optical systems. For systems that use short optical pulses to process or transmit analog information, this limitation is magnified due to the higher peak intensity at the photodetector input. In this paper, we examine the trade-off between signal-to-noise ratio (SNR) and linearity in optically sampled analog-to-digital converters (ADCs) due to saturation of the photodetector responsivity.

Keywords

analogue-digital conversion; optical communication equipment; optical noise; optical saturation; photodetectors; high-dynamic-range analog optical systems; optically sampled analog-to-digital converters; peak intensity; photodetector input; photodetector nonlinearities; photodetector responsivity saturation; photonic analog-to-digital converters; short optical pulses; signal-to-noise ratio; Analog-digital conversion; Bandwidth; Delay; Electrooptical waveguides; Microwave devices; Optical pulses; PIN photodiodes; Photodetectors; Pulse measurements; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the

Conference_Location

Long Beach, CA, USA

Print_ISBN

1-55752-706-7

Type

conf

DOI

10.1109/CLEO.2002.1033368

Filename

1033368