DocumentCode :
2259784
Title :
Noise-induced breakdown of stochastic resonant behavior of van der Pol oscillators coupled by time-varying resistor
Author :
Uwate, Yoko ; Nishio, Yoshifumi ; Stoop, Ruedi
Author_Institution :
Inst. of Neuroinfomatics, ETH Zurich, Zurich, Switzerland
fYear :
2009
fDate :
24-27 May 2009
Firstpage :
1887
Lastpage :
1890
Abstract :
We explore the behavior of two van der Pol oscillators coupled by a stochastically time-varying resistor. We observe switching between in-phase and anti-phase synchronization and analyze the statistics of the switching, with and without additional noise. We find stochastic resonant behavior of synchronization in both regimes. Correlating the two noise sources quickly destroys the stochastic resonance phenomenon in the anti-phase synchronization regime. In the in-phase regime, noise correlation first contributes to the synchronization before removing the resonance by taking over the synchronization by its own means.
Keywords :
circuit resonance; electric breakdown; relaxation oscillators; resistors; statistical analysis; switching circuits; synchronisation; time-varying networks; antiphase synchronization; in-phase synchronization; noise correlation; noise-induced breakdown; statistics; stochastic resonance phenomenon; stochastic resonant behavior; stochastically time-varying resistor; switching; van der Pol oscillator; Chaos; Circuit noise; Coupling circuits; Electric breakdown; Information processing; Oscillators; Resistors; Rhythm; Statistical analysis; Stochastic resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3827-3
Electronic_ISBN :
978-1-4244-3828-0
Type :
conf
DOI :
10.1109/ISCAS.2009.5118148
Filename :
5118148
Link To Document :
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