DocumentCode
2259833
Title
A 1.08-Gb/s burst-mode clock and data recovery circuit using the jitter reduction technique
Author
You, Kae-Dyi ; Chiueh, Herming
Author_Institution
Dept. of Commun. Eng., Nat. Chiao-Tung Univ., Hsin-Chu, Taiwan
fYear
2009
fDate
24-27 May 2009
Firstpage
1899
Lastpage
1902
Abstract
A 1.08-Gb/s CMOS half-rate burst-mode clock and data recovery (BMCDR) circuit with a novel jitter reduction technique is presented. There are several discrete delay time values in the programmable delay circuit (PDC) of the edge detector can be selected by five addressing inputs to create a "dynamic average" delay time that equals to half-of-data period (Tbit/2) to ensure minimum jitter accumulation. A prototype chip was designed with TSMC 0.18-mum CMOS 1P6M technology. The occupied die area of the CDR is 0.99 times 0.97 mm2, and the power consumption is 36 mW under a 1.8-V supply voltage.
Keywords
CMOS digital integrated circuits; clock and data recovery circuits; delays; jitter; programmable circuits; CMOS half-rate burst-mode clock and data recovery circuit; bit rate 1.08 Gbit/s; discrete time delay; dynamic average delay time; edge detector; jitter reduction technique; power 36 mW; power consumption; programmable delay circuit; size 0.18 mum; voltage 1.8 V; CMOS technology; Circuit noise; Clocks; Delay effects; Detectors; Fluctuations; Jitter; Passive optical networks; Phase locked loops; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4244-3827-3
Electronic_ISBN
978-1-4244-3828-0
Type
conf
DOI
10.1109/ISCAS.2009.5118151
Filename
5118151
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