DocumentCode
2259837
Title
A dynamic source-drain extension (DSDE) MOSFET using a separately biased conductive spacer
Author
González, Fernando, Sr. ; Mathew, Suraj J. ; Chediak, J.A.
Author_Institution
Micron Technol. Inc., Boise, ID, USA
fYear
2001
fDate
2001
Firstpage
645
Lastpage
648
Abstract
We present a novel device to control short channel effects: a conductive spacer. Placed adjacent to (but isolated from) the gate stack, the conductive spacer functions as an auxiliary gate and is biased independently from the principal gate. This novel auxiliary gate is able to invert a portion of the channel adjacent to the LDD on both the source and the drain side, decreasing the effective channel length. Consequently, it is easier to turn the gate "off" and "on". Using T-CAD simulations, we show a four orders of magnitude reduction in IOFF (at an IDSAT of 700 μA/μm) using the conductive spacer device. Conductive spacers may be useful as scaling continues. It is predicted that nano-scale pass gates with IOFF values as low as 1 pA/μm may be attainable
Keywords
MOSFET; semiconductor device models; technology CAD (electronics); LDD structures; T-CAD simulations; auxiliary gate; dynamic source-drain extension MOSFET; effective channel length; nano-scale pass gates; separately biased conductive spacer; short channel effects control; turn off current; Computational modeling; Computer simulation; Dielectric breakdown; Electrodes; FinFETs; Implants; Isolation technology; MOSFET circuits; Space technology; Strontium;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2001 International
Conference_Location
Washington, DC
Print_ISBN
0-7803-7432-0
Type
conf
DOI
10.1109/ISDRS.2001.984604
Filename
984604
Link To Document