• DocumentCode
    2259837
  • Title

    A dynamic source-drain extension (DSDE) MOSFET using a separately biased conductive spacer

  • Author

    González, Fernando, Sr. ; Mathew, Suraj J. ; Chediak, J.A.

  • Author_Institution
    Micron Technol. Inc., Boise, ID, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    645
  • Lastpage
    648
  • Abstract
    We present a novel device to control short channel effects: a conductive spacer. Placed adjacent to (but isolated from) the gate stack, the conductive spacer functions as an auxiliary gate and is biased independently from the principal gate. This novel auxiliary gate is able to invert a portion of the channel adjacent to the LDD on both the source and the drain side, decreasing the effective channel length. Consequently, it is easier to turn the gate "off" and "on". Using T-CAD simulations, we show a four orders of magnitude reduction in IOFF (at an IDSAT of 700 μA/μm) using the conductive spacer device. Conductive spacers may be useful as scaling continues. It is predicted that nano-scale pass gates with IOFF values as low as 1 pA/μm may be attainable
  • Keywords
    MOSFET; semiconductor device models; technology CAD (electronics); LDD structures; T-CAD simulations; auxiliary gate; dynamic source-drain extension MOSFET; effective channel length; nano-scale pass gates; separately biased conductive spacer; short channel effects control; turn off current; Computational modeling; Computer simulation; Dielectric breakdown; Electrodes; FinFETs; Implants; Isolation technology; MOSFET circuits; Space technology; Strontium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2001 International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7432-0
  • Type

    conf

  • DOI
    10.1109/ISDRS.2001.984604
  • Filename
    984604