DocumentCode
2259877
Title
Pseudo-CMOS: A novel design style for flexible electronics
Author
Huang, Tsung-Ching ; Fukuda, Kenjiro ; Lo, Chun-Ming ; Yeh, Yung-Hui ; Sekitani, Tsuyoshi ; Someya, Takao ; Cheng, Kwang-Ting
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California at Santa Barbara, Santa Barbara, CA, USA
fYear
2010
fDate
8-12 March 2010
Firstpage
154
Lastpage
159
Abstract
Flexible electronics have attracted much attention since they enable promising applications such as low-cost RFID tags and e-paper. Thin-film transistors (TFTs) are considered as an ideal candidate to implement flexible electronics on low-cost substrates. Most TFT technologies, however, have only mono-type - either n- or p-type - devices and thus modern design technologies for silicon-based electronics cannot be directly applied. In this paper, we propose a novel design style Pseudo-CMOS for flexible electronics that uses only mono-type TFTs while achieving comparable performance with the complementary-type designs. The manufacturing cost and complexity can therefore be significantly reduced while the circuit yield and reliability are also enhanced with the built-in capability of post-fabrication tuning. Some standard cells have been designed and fabricated in p-type organic and n-type InGaZnO (IGZO) TFT technologies which successfully verify the superiority of the proposed Pseudo-CMOS design style. To the best of our knowledge, this is the first design solution that has proven superior performance for both types of TFT technologies.
Keywords
CMOS integrated circuits; flexible electronics; indium compounds; integrated circuit design; integrated circuit reliability; integrated circuit yield; organic semiconductors; thin film circuits; thin film transistors; InGaZnO; circuit reliability; circuit yield; flexible electronic design style; mono type thin film transistors; organic TFT; post fabrication tuning; pseudo CMOS; standard cell; Circuit optimization; Flexible electronics; Manufacturing; Organic thin film transistors; Plastics; RFID tags; Silicon; Substrates; Thermal degradation; Thin film transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457220
Filename
5457220
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