DocumentCode :
2259995
Title :
Optimization of an on-chip active cooling system based on thin-film thermoelectric coolers
Author :
Long, Jieyi ; Memik, Seda Ogrenci ; Grayson, Matthew
Author_Institution :
Dept. of EECS, Northwestern Univ., Evanston, IL, USA
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
117
Lastpage :
122
Abstract :
In this paper, we explore the design and optimization of an on-chip active cooling system based on thin-film thermoelectric coolers (TEC). We start our investigation by establishing the compact thermal model for the chip package with integrated thin-film TEC devices. We observe that deploying an excessive number of TEC devices and/or providing the TEC devices with an improper supply current might adversely result in the overheating of the chip, rendering the cooling system ineffective. A large amount of supply current could even cause the thermal runaway of the system. Motivated by this observation, we formulate the deployment of the integrated TEC devices and their supply current setting as a system-level design problem. We propose a greedy algorithm to determine the deployment of TEC devices and a convex programming based scheme for setting the supply current levels. Leveraging the theory of inverse-positive matrix, we provide an optimality condition for the current setting algorithm. We have tested our algorithms on various benchmarks. We observe that our algorithms are able to determine the proper deployment and supply current level of the TEC devices which reduces the temperatures of the hot spots by as much as 7.5??C compared to the cases without integrated TEC devices.
Keywords :
cooling; greedy algorithms; integrated circuit packaging; matrix algebra; thermoelectric devices; thin film circuits; chip overheating; chip package; compact thermal model; convex programming; greedy algorithm; integrated thin-film; inverse-positive matrix; on-chip active cooling system; system-level design; thin-film thermoelectric coolers; Cooling; Current supplies; Design optimization; Greedy algorithms; Packaging; System-level design; System-on-a-chip; Thermoelectricity; Thin film devices; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457225
Filename :
5457225
Link To Document :
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