Title :
Imaging interferometric microscopy
Author :
Schwarz, C.J. ; Kuznetsova, Y. ; Brueck, Steven R. J.
Author_Institution :
Center for Adv. Studies, New Mexico Univ., Albuquerque, NM, USA
Abstract :
Summary from only given. In order to achieve the resolution of a high-NA objective while retaining the field-of-view and the depth-of-focus and the working distance of a low-NA objective, we introduce the concept of imaging interferometric microscopy. We present experimental results of high-resolution images corresponding to /spl sim/3 times the resolution achieved with a low-NA microscope objective. The results are compared to a theoretical calculation.
Keywords :
image resolution; light interferometry; optical focusing; optical microscopy; depth-of-focus; field-of-view; high-NA objective; high-resolution images; imaging interferometric microscopy; low NA objective; low-NA microscope objective; working distance; Frequency; Gratings; High-resolution imaging; Image resolution; Lenses; Lighting; Microscopy; Optical filters; Optical imaging; Optical interferometry;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1033392
