Title :
Multicore soft error rate stabilization using adaptive dual modular redundancy
Author :
Vadlamani, Ramakrishna ; Zhao, Jia ; Burleson, Wayne ; Tessier, Russell
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
Abstract :
The use of dynamic voltage and frequency scaling (DVFS) in contemporary multicores provides significant protection from unpredictable thermal events. A side effect of DVFS can be an increased processor exposure to soft errors. To address this issue, a flexible fault prevention mechanism has been developed to selectively enable a small amount of per-core dual modular redundancy (DMR) in response to increased vulnerability, as measured by the processor architectural vulnerability factor (AVF). Our new algorithm for DMR deployment aims to provide a stable effective soft error rate (SER) by using DMR in response to DVFS caused by thermal events. The algorithm is implemented in real-time on the multicore using a dedicated monitor network-on-chip and controller which evaluates thermal information and multicore performance statistics. Experiments with a multicore simulator using standard benchmarks show an average 6% improvement in overall power consumption and a stable SER by using selective DMR versus continuous DMR deployment.
Keywords :
error detection; fault tolerant computing; multiprocessing systems; network-on-chip; redundancy; stability; DVFS; adaptive dual modular redundancy; dynamic voltage and frequency scaling; flexible fault prevention mechanism; monitor network-on-chip; multicore performance statistics; multicore soft error rate stabilization; per-core DMR; per-core dual modular redundancy; power consumption; processor AVF; processor architectural vulnerability factor; stable SER; thermal information; Dynamic voltage scaling; Energy consumption; Error analysis; Frequency; Monitoring; Multicore processing; Network-on-a-chip; Protection; Redundancy; Statistics; DVFS; architectural vulnerability; monitor network;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5457242