DocumentCode :
2260424
Title :
Improved rotational invariance for statistical inverse in electrical impedance tomography
Author :
Lahtinen, Jani ; Martinsen, Tomas ; Lampinen, Jouko
Author_Institution :
Lab. of Comput. Eng., Helsinki Univ. of Technol., Espoo, Finland
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
154
Abstract :
In this paper we show that rotational invariance can be improved in a neural network based electrical impedance tomography (EIT) reconstruction approach by a suitably chosen permutation of the input data. The input space is partitioned to nonoverlapping sectors, and the input signal is permuted so that it lies in one sector independent of the original rotation angle. We demonstrate the advantages of the method with computer simulations. The proposed approach yields better results in the inverse problem, and allows use of smaller networks with fewer training samples
Keywords :
Computerised tomography; Electric impedance imaging; Image reconstruction; Neural nets; Statistical analysis; electrical impedance tomography; improved rotational invariance; neural network based EIT reconstruction; nonoverlapping sectors; statistical inverse; Conductivity measurement; Current measurement; Electrodes; Image reconstruction; Inverse problems; Neural networks; Space technology; Surface impedance; Surface reconstruction; Tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 2000. IJCNN 2000, Proceedings of the IEEE-INNS-ENNS International Joint Conference on
Conference_Location :
Como
ISSN :
1098-7576
Print_ISBN :
0-7695-0619-4
Type :
conf
DOI :
10.1109/IJCNN.2000.857890
Filename :
857890
Link To Document :
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