• DocumentCode
    2260429
  • Title

    Large strain-induced conductivity anisotropy in VO2 thin films probed by THz spectroscopy

  • Author

    Liu, Mengkun ; Abreu, Elsa ; Lu, Jiwei ; West, Kevin G. ; Kittiwatanakul, Salinporn ; Yin, Wenjing ; Wolf, Stuart ; Averitt, Richard D.

  • Author_Institution
    Dept. of Phys., Boston Univ., Boston, MA, USA
  • fYear
    2011
  • fDate
    1-6 May 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We probe the temperature dependent far-infrared conductivity of highly strained (100)VO2 thin films using THz TDS. A large in-plane anisotropy is observed in both the metallic conductivity and the metal-insulator transition temperature.
  • Keywords
    electrical conductivity; high-speed optical techniques; infrared spectra; insulating thin films; metal-insulator transition; terahertz wave spectra; vanadium compounds; VO2; large strain-induced conductivity anisotropy; metal-insulator transition temperature; metallic conductivity; temperature dependent far-infrared conductivity; terahertz time domain spectroscopy; thin films; Anisotropic magnetoresistance; Conductivity; Films; Spectroscopy; Strain; Temperature distribution; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2011 Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-4577-1223-4
  • Type

    conf

  • Filename
    5951472
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2260429