Title :
Final value of aliasing error probability for transition counting
Author :
Seireg, Reda H. ; Vacroux, André G.
Author_Institution :
Mil. Tech. Coll., Cairo, Egypt
Abstract :
The Aliasing Error Probability (AEP) is the most important parameter for evaluation of any compaction method. The general formula for AEP was deduced for the transition counting technique under the assumption that the input sequence is equally likely. In this paper Markov processes are used to calculate the Final Value of AEP (FV-AEP) for the Transition Counting (TC) technique. A general formula is deduced which depends on the counter module. The new equation allows a comparison between the TC technique and the linear technique
Keywords :
Markov processes; circuit testing; error statistics; probability; Markov processes; aliasing error probability; compaction method; counter module; transition counting; Circuit faults; Circuit testing; Cities and towns; Clocks; Compaction; Counting circuits; Educational institutions; Equations; Error probability; Markov processes;
Conference_Titel :
Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
0-7803-1760-2
DOI :
10.1109/MWSCAS.1993.342955