DocumentCode
2261177
Title
Techniques for finding Xs in test sequences for sequential circuits and applications to test length/power reduction
Author
Higami, Yoshinobu ; Kobayashi, Sin-ya ; Takamatsu, Yuzo ; Kajihara, Seiji
Author_Institution
Dept. of Comput. Sci., Ehime Univ., Japan
fYear
2004
fDate
15-17 Nov. 2004
Firstpage
46
Lastpage
49
Abstract
In this paper, we propose techniques for finding Xs in test sequences for sequential circuits. Also we show two applications that utilize the obtained test sequences with Xs: reduction of the power during test and test compaction.
Keywords
automatic test pattern generation; power consumption; sequential circuits; sequential circuits; test compaction; test length reduction; test power reduction; test sequences; Application software; Circuit faults; Circuit testing; Compaction; Computer science; Electrical fault detection; Electronic equipment testing; Fault detection; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. 13th Asian
ISSN
1081-7735
Print_ISBN
0-7695-2235-1
Type
conf
DOI
10.1109/ATS.2004.80
Filename
1376534
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