Title :
Techniques for finding Xs in test sequences for sequential circuits and applications to test length/power reduction
Author :
Higami, Yoshinobu ; Kobayashi, Sin-ya ; Takamatsu, Yuzo ; Kajihara, Seiji
Author_Institution :
Dept. of Comput. Sci., Ehime Univ., Japan
Abstract :
In this paper, we propose techniques for finding Xs in test sequences for sequential circuits. Also we show two applications that utilize the obtained test sequences with Xs: reduction of the power during test and test compaction.
Keywords :
automatic test pattern generation; power consumption; sequential circuits; sequential circuits; test compaction; test length reduction; test power reduction; test sequences; Application software; Circuit faults; Circuit testing; Compaction; Computer science; Electrical fault detection; Electronic equipment testing; Fault detection; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Symposium, 2004. 13th Asian
Print_ISBN :
0-7695-2235-1
DOI :
10.1109/ATS.2004.80
