The augmented 3D-tree fault-tolerant network

Author

Belkadi, Mustapha ; Mouftah, H.T.

Author_Institution

Dept. of Electr. Eng., Queen´´s Univ., Kingston, Ont., Canada

fYear

1993

fDate

16-18 Aug 1993

Firstpage

621

Abstract

The present paper discusses the design and reliability analysis of the Augmented 3D-Tree Switching network (A3DT). The latter was developed as a result of the vulnerability of the 3D-Tree (3DT) switching network towards certain critical multiple-fault patterns that cause cell loss under a dynamic rerouting scheme even though other fault-free paths might exist. The A3DT network is based on 4×6 Switching Elements (SE) interconnected in such a way as to enhance the immunity of the 3DT network towards the multiple-fault patterns under consideration; yet without destroying the properties of the underlying network

Keywords

fault tolerant computing; fault trees; multistage interconnection networks; network routing; augmented 3D-tree fault-tolerant network; cell sequencing; critical multiple-fault patterns; dynamic rerouting scheme; multistage interconnection networks; reliability analysis; switching elements interconnection; Algorithm design and analysis; Degradation; Design methodology; Fault tolerance; Joining processes; Multiprocessor interconnection networks; Redundancy; Routing; Tree graphs;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on

Conference_Location

Detroit, MI

Print_ISBN

0-7803-1760-2

Type

conf

DOI

10.1109/MWSCAS.1993.342970

Filename

342970