DocumentCode
2261539
Title
High level fault injection for attack simulation in smart cards
Author
Rothbart, K. ; Neffe, U. ; Steger, Ch. ; Weiss, R. ; Rieger, E. ; Muehlberger, A.
Author_Institution
Graz Univ. of Technol., Austria
fYear
2004
fDate
15-17 Nov. 2004
Firstpage
118
Lastpage
121
Abstract
Smart cards are one of the smallest computing platforms in use today. They are used in an increasing number of security applications. To gain sensitive data, a lot of security attacks are performed on smart cards. Therefore it is mandatory to test smart cards for robustness in matters of security. Tests are very time consuming and are performed often very late in the design process. This paper presents a methodology for high-level fault injection for security attack simulation in smart cards. The fault injection technique into SystemC designs is described and the fault injection tool is presented. Moreover, the system behaviour analysis is depicted. Preliminary results show that this methodology can assist in finding system components vulnerable to security attacks.
Keywords
built-in self test; fault simulation; integrated circuit testing; security of data; smart cards; system-on-chip; SystemC designs; high level fault injection; security attack simulation; smart cards testing; system behaviour analysis; Analytical models; Circuit faults; Data security; Information analysis; Information security; Performance evaluation; Process design; Robustness; Smart cards; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. 13th Asian
ISSN
1081-7735
Print_ISBN
0-7695-2235-1
Type
conf
DOI
10.1109/ATS.2004.48
Filename
1376546
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